Eliminating Layer Undulation Textures in SSFLC Devices
SID Symposium Digest of Technical Papers
Temperature dependence of the smectic layer structures was studied by high resolution X-ray diffraction analysis. The investigation was based on two different alignment SSFLC cells. The effect of layer spacing changes in the SmA phase on defects seen in the SmC phase of the devices is investigated. It is shown that when considering a defect free SmC* texture, the layer spacing changes in the SmA phase are more significant than changes in the SmC phase. An explanation is also proposed.
Wang, Chenhui; Bos, Philip J.; Kumar, Satyendra; Wand, Michael; and Handschy, Mark A. (2003). Eliminating Layer Undulation Textures in SSFLC Devices. SID Symposium Digest of Technical Papers 34(1), 608-611. doi: 10.1889/1.1832349 Retrieved from https://digitalcommons.kent.edu/phypubs/171