Reznikov, M., Bos, P., & O’Callaghan, M. (2010). The Effect of Siox Alignment Layer Thickness on the Switching of Smc* Bistable Liquid Crystal Devices (1–). Journal of Applied Physics. https://doi.org/10.1063/1.3273482
Reznikov, Mitya, Philip Bos, and Michael O’Callaghan. 2010. “The Effect of Siox Alignment Layer Thickness on the Switching of Smc* Bistable Liquid Crystal Devices”. Journal of Applied Physics. https://doi.org/10.1063/1.3273482.
Reznikov, Mitya, et al. The Effect of Siox Alignment Layer Thickness on the Switching of Smc* Bistable Liquid Crystal Devices. Journal of Applied Physics, 4 Jan. 2010, https://doi.org/10.1063/1.3273482.
Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in J. Appl. Phys. 107, 014103 (2010) and may be found at http://dx.doi.org/10.1063/1.3273482