Publication Title

Physical Review Letters

Publication Date

10-25-1993

Document Type

Article

DOI

10.1103/PhysRevLett.71.2773

Keywords

X Ray Reflectivity, Surface

Disciplines

Physics

Abstract

Results of a high resolution x-ray reflectivity study of growth morphology and ordering of thin liquid-crystal films on flat glass substrate are reported. An adsorbed bilayer of crystalline order, under three dimensional clusters, was found to persist well beyond the nematic to isotropic transition. This adsorbed layer appears to be related to the surface memory effects in liquid-crystal devices. The morphology of these films can be described by the Stranski-Krastanov growth mode.

Comments

Copyright 1993 American Physical Society. Available on publisher's site at http://dx.doi.org/10.1103/PhysRevLett.71.2773.


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