Huang, Y., Bos, P., & Bhowmik, A. (2010). The Ion Capturing Effect of 5 Degrees Siox Alignment Films in Liquid Crystal Devices (1–). Journal of Applied Physics. https://doi.org/10.1063/1.3481088
Huang, Yi, Philip Bos, and Achintya Bhowmik. 2010. “The Ion Capturing Effect of 5 Degrees Siox Alignment Films in Liquid Crystal Devices”. Journal of Applied Physics. https://doi.org/10.1063/1.3481088.
Huang, Yi, et al. The Ion Capturing Effect of 5 Degrees Siox Alignment Films in Liquid Crystal Devices. Journal of Applied Physics, 17 Sept. 2010, https://doi.org/10.1063/1.3481088.
Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in J. Appl. Phys. 108, 064502 (2010) and may be found at http://dx.doi.org/10.1063/1.3481088